Vol. 2024 No. 4

Published: 2024-09-05

Articles

SAT-based Formal Verification of Fault Injection Countermeasures for Cryptographic Circuits

Huiyu Tan, Pengfei Gao, Fu Song, Taolue Chen, Zhilin Wu

1-39
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SPA-GPT: General Pulse Tailor for Simple Power Analysis Based on Reinforcement Learning

Ziyu Wang, Yaoling Ding, An Wang, Yuwei Zhang, Congming Wei, Shaofei Sun, Liehuang Zhu

40-83
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Enabling PERK and other MPC-in-the-Head Signatures on Resource-Constrained Devices

Slim Bettaieb, Loïc Bidoux, Alessandro Budroni, Marco Palumbi, Lucas Pandolfo Perin

84-109
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Closing the Gap: Leakage Contracts for Processors with Transitions and Glitches

Johannes Haring, Vedad Hadži´c, Roderick Bloem

110-132
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Another Evidence to not Employ Customized Masked Hardware Identifying and Fixing Flaws in SCARV

Felix Uhle, Florian Stolz, Amir Moradi

133-155
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A Not So Discrete Sampler: Power Analysis Attacks on HAWK signature scheme

Morgane Guerreau, Mélissa Rossi

156-178
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Fault-Resistant Partitioning of Secure CPUs for System Co-Verification against Faults

Simon Tollec, Vedad Hadži´c, Pascal Nasahl, Mihail Asavoae, Roderick Bloem, Damien Couroussé, Karine Heydemann, Mathieu Jan, Stefan Mangard

179-204
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Fast Transciphering Via Batched And Reconfigurable LUT Evaluation

Leonard Schild, Aysajan Abidin, Bart Preneel

205-230
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Breaking Ground: A New Area Record for Low-Latency First-Order Masked SHA-3 Advancing from the 4x Area Era to the 3x Area Era

Cankun Zhao, Hang Zhao, Jiangxue Liu, Bohan Yang, Wenping Zhu, Shuying Yin, Min Zhu, Shaojun Wei, Leibo Liu

231-257
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Elastic MSM: A Fast, Elastic and Modular Preprocessing Technique for Multi-Scalar Multiplication Algorithm on GPUs

Xudong Zhu, Haoqi He, Zhengbang Yang, Yi Deng, Lutan Zhao, Rui Hou

258-284
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TRNG Entropy Model in the Presence of Flicker FM Noise

Adriaan Peetermans, Ingrid Verbauwhede

285-306
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Combined Threshold Implementation

Jakob Feldtkeller, Jan Richter-Brockmann, Pascal Sasdrich, Tim Güneysu

307-334
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Improved High-Order Masked Generation of Masking Vector and Rejection Sampling in Dilithium

Jean-Sébastien Coron, François Gérard, Tancrède Lepoint, Matthias Trannoy, Rina Zeitoun

335-354
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pyecsca: Reverse engineering black-box elliptic curve cryptography via side-channel analysis

Jan Jancar, Vojtech Suchanek, Petr Svenda, Vladimir Sedlacek, Łukasz Chmielewski

355-381
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Phase Modulation Side Channels: Jittery JTAG for On-Chip Voltage Measurements

Colin O’Flynn

382-424
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Switching Off your Device Does Not Protect Against Fault Attacks

Paul Grandamme, Pierre-Antoine Tissot, Lilian Bossuet, Jean-Max Dutertre, Brice Colombier, Vincent Grosso

425-450
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Robust but Relaxed Probing Model

Nicolai Müller, Amir Moradi

451-482
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Masking FALCON’s Floating-Point Multiplication in Hardware

Emre Karabulut, Aydin Aysu

483-508
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Static Leakage in Dual-Rail Precharge Logics

Bijan Fadaeinia, Thorben Moos, Amir Moradi

509-540
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Through the Looking-Glass: Sensitive Data Extraction by Optical Probing of Scan Chains

Tuba Kiyan, Lars Renkes, Marvin Sass, Antonio Saavedra, Norbert Herfurth, Elham Amini, Jean-Pierre Seifert

541-568
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Bake It Till You Make It Heat-induced Power Leakage from Masked Neural Networks

Dev M. Mehta, Mohammad Hashemi, David S. Koblah, Domenic Forte, Fatemeh Ganji

569-609
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FaultDetective Explainable to a Fault, from the Design Layout to the Software

Zhenyuan Liu, Dillibabu Shanmugam, Patrick Schaumont

610-632
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Improved Circuit Synthesis with Multi-Value Bootstrapping for FHEW-like Schemes

Johannes Mono, Kamil Kluczniak, Tim Güneysu

633-656
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An Algebraic Approach for Evaluating Random Probing Security With Application to AES

Vahid Jahandideh, Bart Mennink, Lejla Batina

657-689
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Prime Masking vs. Faults - Exponential Security Amplification against Selected Classes of Attacks

Thorben Moos, Sayandeep Saha, François-Xavier Standaert

690-736
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Faster Complete Addition Laws for Montgomery Curves

Reza Rezaeian Farashahi, Mojtaba Fadavi, Soheila Sabbaghian

737-762
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Know-Thy-Basis: Decomposing F26 for Lightweight S-box Implementation

Dilip Sau, Sumanta Sarkar, Dhiman Saha, Kalikinkar Mandal

763-794
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