On the application of Two-Photon Absorption for Laser Fault Injection attacks

Pushing the physical boundaries for Laser-based Fault Injection

Authors

  • Bodo Selmke Fraunhofer Institute for Applied and Integrated Security (AISEC), Munich, Germany
  • Maximilian Pollanka Technical University of Munich (TUM), Chair for Laser and X-ray Physics, Munich, Germany
  • Andreas Duensing Technical University of Munich (TUM), Chair for Laser and X-ray Physics, Munich, Germany
  • Emanuele Strieder Fraunhofer Institute for Applied and Integrated Security (AISEC), Munich, Germany
  • Hayden Wen Technical University of Munich (TUM), Chair for Laser and X-ray Physics, Munich, Germany
  • Michael Mittermair Technical University of Munich (TUM), Chair for Laser and X-ray Physics, Munich, Germany
  • Reinhard Technical University of Munich (TUM), Chair for Laser and X-ray Physics, Munich, Germany
  • Georg Sigl Fraunhofer Institute for Applied and Integrated Security (AISEC), Munich, Germany; Technical University of Munich (TUM), Chair of Security in Information Technology, Munich, Germany

DOI:

https://doi.org/10.46586/tches.v2022.i4.862-885

Keywords:

Laser Fault Injection, Countermeasures, Single-Photon Absorption, Two-Photon Absorption, Fault Attacks

Abstract

Laser Fault Injection (LFI) is considered to be the most powerful semiinvasive fault injection method for implementation attacks on security devices. In this work we discuss for the first time the application of the nonlinear Two-Photon Absorption (TPA) effect for the purpose of LFI. Though TPA is an established technique in other areas, e.g. fluorescence microscopy, so far it did not receive any attention in the field of physical attack methods on integrated circuits. We show that TPA has several superior properties over the regular linear LFI method. The TPA effect allows to work on non-thinned devices without increasing the induced energy and hence the stress on the device. In contrast to regular LFI, the nonlinearity of the TPA effect leads to increased precision due to the steeper descent in intensity and also a vertically restricted photoelectric effect. By practical experiments, we demonstrate the general applicability of the method for a specific device and that unlike a regular LFI setup, TPA-LFI is capable to inject faults without triggering a latch-up effect. In addition we discuss the possible implications of TPA-LFI on various sensor-based countermeasures.

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Published

2022-08-31

How to Cite

Selmke, B., Pollanka, M., Duensing, A., Strieder, E., Wen, H., Mittermair, M., Reinhard, & Sigl, G. (2022). On the application of Two-Photon Absorption for Laser Fault Injection attacks: Pushing the physical boundaries for Laser-based Fault Injection. IACR Transactions on Cryptographic Hardware and Embedded Systems, 2022(4), 862–885. https://doi.org/10.46586/tches.v2022.i4.862-885

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Articles