A TRAP for SAT: On the Imperviousness of a Transistor-Level Programmable Fabric to Satisfiability-Based Attacks

Authors

  • Aric Fowler University of Texas at Dallas, Richardson, TX, USA
  • Shayan Mohammed University of Texas at Dallas, Richardson, TX, USA
  • Mustafa Shihab University of Texas at Dallas, Richardson, TX, USA
  • Thomas Broadfoot University of Texas at Dallas, Richardson, TX, USA
  • Peter Beerel University of Southern California, Los Angeles, CA, USA
  • Carl Sechen University of Texas at Dallas, Richardson, TX, USA
  • Yiorgos Makris University of Texas at Dallas, Richardson, TX, USA

DOI:

https://doi.org/10.46586/tches.v2025.i2.579-603

Keywords:

Logic Redaction, SAT Attack, TRAP

Abstract

Locking-based intellectual property (IP) protection for integrated circuits (ICs) being manufactured at untrusted facilities has been largely defeated by the satisfiability (SAT) attack, which can retrieve the secret key needed for instantiating proprietary functionality on locked circuits. As a result, redaction-based methods have gained popularity as a more secure way of protecting hardware IP. Among these methods, transistor-level programming (TRAP) prohibits the outright use of SAT attacks due to the mismatch between the logic-level at which SAT attack operates and the switch-level at which the TRAP fabric is programmed. Herein, we discuss the challenges involved in launching SAT attacks on TRAP and we propose solutions which enable expression of TRAP in propositional logic modeling in a way that accurately reflects switch-level circuit capabilities. Results obtained using a transistor-level SAT attack tool-set that we developed and are releasing corroborate that SAT attacks can be launched against TRAP. However, the increased complexity of switch-level circuit modeling prevents the attack from realistically compromising all but the most trivial IP-protected designs.

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Published

2025-03-04

Issue

Section

Articles

How to Cite

Fowler, A., Mohammed, S., Shihab, M., Broadfoot, T., Beerel, P., Sechen, C., & Makris, Y. (2025). A TRAP for SAT: On the Imperviousness of a Transistor-Level Programmable Fabric to Satisfiability-Based Attacks. IACR Transactions on Cryptographic Hardware and Embedded Systems, 2025(2), 579-603. https://doi.org/10.46586/tches.v2025.i2.579-603