“Improved High-Order Masked Generation of Masking Vector and Rejection Sampling in Dilithium”. IACR Transactions on Cryptographic Hardware and Embedded Systems 2024, no. 4 (September 5, 2024): 335–354. Accessed October 15, 2024. https://tches.iacr.org/index.php/TCHES/article/view/11795.