Zaid, G., Bossuet, L., Dassance, F., Habrard, A. and Venelli, A. (2020) “Ranking Loss: Maximizing the Success Rate in Deep Learning Side-Channel Analysis”, IACR Transactions on Cryptographic Hardware and Embedded Systems, 2021(1), pp. 25-55. doi: 10.46586/tches.v2021.i1.25-55.