Svenda, Petr, Antonin Dufka, Milan Broz, Roman Lacko, Tomas Jaros, Daniel Zatovic, and Josef Pospisil. 2024. “TPMScan: A Wide-Scale Study of Security-Relevant Properties of TPM 2.0 Chips”. IACR Transactions on Cryptographic Hardware and Embedded Systems 2024 (2):714-34. https://doi.org/10.46586/tches.v2024.i2.714-734.