PERIN, G.; WU, L.; PICEK, S. Exploring Feature Selection Scenarios for Deep Learning-based Side-channel Analysis. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2022, n. 4, p. 828–861, 2022. DOI: 10.46586/tches.v2022.i4.828-861. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/9842. Acesso em: 26 sep. 2022.