KIAEI, P.; SCHAUMONT, P. SoC Root Canal! Root Cause Analysis of Power Side-Channel Leakage in System-on-Chip Designs. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2022, n. 4, p. 751–773, 2022. DOI: 10.46586/tches.v2022.i4.751-773. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/9839. Acesso em: 1 oct. 2022.