NASAHL, P.; OSORIO, M.; VOGEL, P.; SCHAFFNER, M.; TRIPPEL, T.; RIZZO, D.; MANGARD, S. SYNFI: Pre-Silicon Fault Analysis of an Open-Source Secure Element. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2022, n. 4, p. 56–87, 2022. DOI: 10.46586/tches.v2022.i4.56-87. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/9813. Acesso em: 1 oct. 2022.