BELLIZIA, D.; HOFFMANN, C.; KAMEL, D.; MÉAUX, P.; STANDAERT, F.-X. When Bad News Become Good News: Towards Usable Instances of Learning with Physical Errors. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2022, n. 4, p. 1–24, 2022. DOI: 10.46586/tches.v2022.i4.1-24. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/9811. Acesso em: 26 sep. 2022.