WU, L.; PERIN, G.; PICEK, S. The Best of Two Worlds: Deep Learning-assisted Template Attack. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2022, n. 3, p. 413–437, 2022. DOI: 10.46586/tches.v2022.i3.413-437. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/9707. Acesso em: 5 jul. 2022.