BERTI, Francesco; BHASIN, Shivam; BREIER, Jakub; HOU, Xiaolu; POUSSIER, Romain; STANDAERT, François-Xavier; UDVARHELYI, Balasz. A Finer-Grain Analysis of the Leakage (Non) Resilience of OCB. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2022, n. 1, p. 461–481, 2021. DOI: 10.46586/tches.v2022.i1.461-481. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/9304. Acesso em: 29 mar. 2024.