BERTI, F.; BHASIN, S.; BREIER, J.; HOU, X.; POUSSIER, R.; STANDAERT, F.-X.; UDVARHELYI, B. A Finer-Grain Analysis of the Leakage (Non) Resilience of OCB. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2022, n. 1, p. 461–481, 2021. DOI: 10.46586/tches.v2022.i1.461-481. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/9304. Acesso em: 19 jan. 2022.