SAHA, Sayandeep; MUKHOPADHYAY, Debdeep; DASGUPTA, Pallab. ExpFault: An Automated Framework for Exploitable Fault Characterization in Block Ciphers. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2018, n. 2, p. 242–276, 2018. DOI: 10.13154/tches.v2018.i2.242-276. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/882. Acesso em: 28 mar. 2024.