Fault Injection as an Oscilloscope: Fault Correlation Analysis. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2021, n. 1, p. 192–216, 2020. DOI: 10.46586/tches.v2021.i1.192-216. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/8732.. Acesso em: 14 jul. 2024.