ZAID, Gabriel; BOSSUET, Lilian; DASSANCE, François; HABRARD, Amaury; VENELLI, Alexandre. Ranking Loss: Maximizing the Success Rate in Deep Learning Side-Channel Analysis. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2021, n. 1, p. 25–55, 2020. DOI: 10.46586/tches.v2021.i1.25-55. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/8726. Acesso em: 29 mar. 2024.