UENO, Rei; KAZUMORI, Kohei; HOMMA, Naofumi. Rejection Sampling Schemes for Extracting Uniform Distribution from Biased PUFs. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2020, n. 4, p. 86–128, 2020. DOI: 10.13154/tches.v2020.i4.86-128. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/8678. Acesso em: 19 apr. 2024.