MASURE, L.; DUMAS, C.; PROUFF, E. A Comprehensive Study of Deep Learning for Side-Channel Analysis. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2020, n. 1, p. 348–375, 2019. DOI: 10.13154/tches.v2020.i1.348-375. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/8402. Acesso em: 2 dec. 2022.