KARIMI, N.; MOOS, T.; MORADI, A. Exploring the Effect of Device Aging on Static Power Analysis Attacks. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2019, n. 3, p. 233–256, 2019. DOI: 10.13154/tches.v2019.i3.233-256. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/8295. Acesso em: 1 oct. 2022.