MOOS, Thorben. Static Power SCA of Sub-100 nm CMOS ASICs and the Insecurity of Masking Schemes in Low-Noise Environments. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2019, n. 3, p. 202–232, 2019. DOI: 10.13154/tches.v2019.i3.202-232. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/8294. Acesso em: 29 mar. 2024.