PICEK, S.; HEUSER, A.; JOVIC, A.; BHASIN, S.; REGAZZONI, F. The Curse of Class Imbalance and Conflicting Metrics with Machine Learning for Side-channel Evaluations. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2019, n. 1, p. 209–237, 2018. DOI: 10.13154/tches.v2019.i1.209-237. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/7339. Acesso em: 30 may. 2023.