SVENDA, Petr; DUFKA, Antonin; BROZ, Milan; LACKO, Roman; JAROS, Tomas; ZATOVIC, Daniel; POSPISIL, Josef. TPMScan: A wide-scale study of security-relevant properties of TPM 2.0 chips. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2024, n. 2, p. 714–734, 2024. DOI: 10.46586/tches.v2024.i2.714-734. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/11444. Acesso em: 9 may. 2024.