ZHANG, F.; HUANG, R.; FENG, T.; GONG, X.; TAO, Y.; REN, K.; ZHAO, X.; GUO, S. Efficient Persistent Fault Analysis with Small Number of Chosen Plaintexts. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2023, n. 2, p. 519–542, 2023. DOI: 10.46586/tches.v2023.i2.519-542. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/10292. Acesso em: 21 mar. 2023.