YAP, Trevor; BENAMIRA, Adrien; BHASIN, Shivam; PEYRIN, Thomas. Peek into the Black-Box: Interpretable Neural Network using SAT Equations in Side-Channel Analysis. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2023, n. 2, p. 24–53, 2023. DOI: 10.46586/tches.v2023.i2.24-53. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/10276. Acesso em: 25 apr. 2024.