MEHTA, Dev M.; HASHEMI, Mohammad; KOBLAH, David S.; FORTE, Domenic; GANJI, Fatemeh. Bake It Till You Make It: Heat-induced Power Leakage from Masked Neural Networks. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2024, n. 4, p. 569–609, 2024. DOI: 10.46586/tches.v2024.i4.569-609. Disponível em: https://tches.iacr.org/index.php/TCHES/article/view/11803.. Acesso em: 1 apr. 2025.