Nasahl, P., Osorio, M., Vogel, P., Schaffner, M., Trippel, T., Rizzo, D., & Mangard, S. (2022). SYNFI: Pre-Silicon Fault Analysis of an Open-Source Secure Element. IACR Transactions on Cryptographic Hardware and Embedded Systems, 2022(4), 56–87. https://doi.org/10.46586/tches.v2022.i4.56-87