[1]
Nasahl, P., Osorio, M., Vogel, P., Schaffner, M., Trippel, T., Rizzo, D. and Mangard, S. 2022. SYNFI: Pre-Silicon Fault Analysis of an Open-Source Secure Element. IACR Transactions on Cryptographic Hardware and Embedded Systems. 2022, 4 (Aug. 2022), 56–87. DOI:https://doi.org/10.46586/tches.v2022.i4.56-87.