[1]
Bellizia, D. et al. 2022. When Bad News Become Good News: Towards Usable Instances of Learning with Physical Errors. IACR Transactions on Cryptographic Hardware and Embedded Systems. 2022, 4 (Aug. 2022), 1–24. DOI:https://doi.org/10.46586/tches.v2022.i4.1-24.