[1]
Karimi, N., Moos, T. and Moradi, A. 2019. Exploring the Effect of Device Aging on Static Power Analysis Attacks. IACR Transactions on Cryptographic Hardware and Embedded Systems. 2019, 3 (May 2019), 233-256. DOI:https://doi.org/10.13154/tches.v2019.i3.233-256.