Moos, T. 2019. Static Power SCA of Sub-100 nm CMOS ASICs and the Insecurity of Masking Schemes in Low-Noise Environments. IACR Transactions on Cryptographic Hardware and Embedded Systems. 2019, 3 (May 2019), 202–232. DOI:https://doi.org/10.13154/tches.v2019.i3.202-232.